Scanning Electron Microscope (SEM)

Scanning Electron Microscope (SEM)

Image formation in an SEM is accomplished through collection of the secondary electrons / back scattered electrons generated due to interaction of an electron beam with the material of the specimens. The characteristic X-rays generated from the specimens during this interaction are used for elemental analysis.

 

 

 

  Equipment Details

  Key Features

  Application Areas

 Model:EVO 18 Research

 Manufacturer:Carl Zeiss, UK

 Resolution:15 nm in SE mode

 Operating Parameters:0.2 to 30 kV accelerating voltage and 0.5 pA to 5 µA probe current

  • LaB6 / tungsten filament
  • Fitted with Energy Dispersive X-ray spectrometer (EDAX make)
  • Elements with atomic number higher than boron can be detected
  • Semi-quantitative composition analysis
  • Fractography
  • Microstructural analysis
  • X-ray mapping of elements


Last updated on : 12-06-2018 09:30:28am