Investigation of interface properties of sputter deposited TiN/CrN...

Investigation of interface properties of sputter deposited TiN/CrN...

Investigation of interface properties of sputter deposited TiN/CrN superlattices by low-angle X-ray reflectivity, H. C. Barshilia, N. Selvakumar, K. S. Rajam, K. Gopinadhan, S. Chaudhary, Journal of Physics-D: Applied Physics, 41 (2008) 205409, doi:10.1088/0022-3727/41/20/205409


Last updated on : 11-01-2018 12:00:16pm