Thin Film X-ray Diffractometer

Thin Film X-ray Diffractometer

X-ray diffraction (XRD) is a simple non-destructive technique used to obtain detailed information about the crystallographic structure of materials. 

 

 

MAKE AND MODEL: Bruker D8 ADVANCE

SOURCE: Cu Ka radiation

GEOMETRY: Bragg-Brentano geometry

ATTACHMENTS: Powder and thin films attachments

DETECTOR: High-speed energy-dispersive LYNXEYE XE-T 


Last updated on : 12-06-2018 11:01:41am